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YUSHI LM330 Integrated Portable Leeb Hardness Tester
18th Jul 2026, 12:16 PM

YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication

Price may vary by location, shipping cost, and availability.
Lowest in last 3 months
70% Off
$820.00
$2,699.00

Buy @ amazon.com
Highest: $820.00
Average: $820.00
Lowest: $820.00

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Based our analysis and observation, there is very negligible chances of price to increase or decrease, more likely ro remain constant based on our price historical data.*

Price History Graph

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Price History Information

You can check the price history of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication here. This product's current Price in USA is $820.00. The average and highest prices are $820.00 and $820.00 respectively.

Lowest Ever Price $820.00
23rd Mar 2026
Average Price $820.00
Based on 120 days price tracking
Highest Price $820.00
23rd Mar 2026

Current Price in USA

Price $820.00
MRP $2,699.00
Savings $1,879.00
Discount 69.61%

Product Information

Details

Product Name YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication
Store Product Code B01NCE9FVS
Store Name amazon.com
Rating 10 / 10
Category Hardness Testing Equipment
Product Manufacturer YUSHI INSTRUMENTS
Model Number LM330

Features

  • Pen type design, easy operation, the unique large-screen OLED color display
  • High repeat-ability, with replaceable battery compartment
  • Measure the hardness scale HB, HRC, HRB, HV, HS, HL and strength b
  • Compatible with D / DL impact device
  • Increased data storage and communication functions

Images

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Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type Impact Device /D Test Block, plus Data Large Storage, Data Communication

Rating and Reviews

10 Based on 2 reviews

YUSHI LM330 Integrated Portable Leeb Hardness Tester has 10 rating out of 10. This average rating is consist of 2 individual ratings. You can rate this product at product review page.

* Predictions is created on based of past prices and trends, it does not guarantee that it will happen. These are just prediction for theoretical information only.
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