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YUSHI LM330 Integrated Portable Leeb Hardness Tester
18th Jul 2026, 12:16 PM

YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block

Price may vary by location, shipping cost, and availability.
Lowest in last 6 years
$820.00

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Highest: $820.00
Average: $820.00
Lowest: $820.00

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Based our analysis and observation, there is very negligible chances of price to increase or decrease, more likely ro remain constant based on our price historical data.*

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Price History Information

You can check the price history of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block here. This product's current Price in USA is $820.00. The average and highest prices are $820.00 and $820.00 respectively.

Lowest Ever Price $820.00
27th Apr 2020
Average Price $820.00
Based on 2277 days price tracking
Highest Price $820.00
27th Apr 2020

Current Price in USA

Price $820.00

Product Information

Details

Product Name YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block
Store Product Code B01N59KR8K
Store Name amazon.com
Rating 10 / 10
Category Hardness Testing Equipment
Product Manufacturer YUSHI INSTRUMENTS
Model Number LM330

Features

  • Contains all the features of LM300, Plus increased data storage and communication functions
  • Pen type design, easy operation, the unique large-screen OLED color display
  • High repeat-ability, with replaceable battery compartment
  • Measure the hardness scale HB, HRC, HRB, HV, HS, HL and strength b
  • Compatible with D / DL impact device

Images

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Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block
Image of YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w /D Test Block

Rating and Reviews

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YUSHI LM330 Integrated Portable Leeb Hardness Tester has 10 rating out of 10. You can rate this product at product review page.

* Predictions is created on based of past prices and trends, it does not guarantee that it will happen. These are just prediction for theoretical information only.
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